Essay On Semiconductor Transistor

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INTRODUCTION
In 1906, L.D Forest invented the first vacuum tube which was used for rectifying, amplifying and switching electrical signals [1]. Vacuum tubes had played an important role in the development of electronics before the advent of semiconductor transistor. In 1947, J. Brattain and W. Bardeen invented the first point contact junction transistor [2,3] and in 1948 W. Schokley proposed bipolar junction transistor (BJT) [4]. In 1951, W. Shockley invented junction field-effect transistor (JFET) [5]. JFET replaced the vacuum tube by a solid state device and found the path for smaller and cheaper electronic devices. In 1958, j. Kilby invented the first integrated circuit and received the Nobel physics prize for his innovative work [6].For the first time, In 1960, D. Kahng fabricated metal-oxide-semiconductor field effect transistors (MOSFETs) on silicon(Si)-substrate using silicon oxide(SiO2)[7].MOSFETs rapidly replaced the JFET and had become core of microelectronics. Due to single polarity of MOSFET, it suffered large power dissipation. In 1963, the complementary metal-oxide-semiconductor (CMOS) field effect transistor (FET) which uses both n-type and p-type MOSFETs [8].
Towards the beginning of the 21st century, For the design of the electronic system enormous efforts have been undertaken. For defence, space, automatic control of industrial processes and medical diagnostics, where two parts namely microprocessor and microsensor actively works during the function of microelectronic device[9-11].Aggressive progress in complementary metal-oxide-semiconductor (CMOS) integrated circuit technology has allowed device performance and speed to meet marketdemand. One such attempt to meet this demand is the continual...

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...FRACTION
This is a technique to study structural details of the samples. By this technique size and shape of the crystal , the average atomic spacing , orientation of the single and ploy crystal are determined.
The materials with a crystalline structure, X‐rays scattered by ordered features will be scattered coherently in certain directions for satisfying the criteria for constructive interference, signal amplification. The conditions required for constructive interference are determined by the English physicist W.H. Bragg and known as Bragg’s law.
The Bragg’s law describing relationship a beam of X-ray having particular wavelength diffracts at certain angle from a crystalline surface defined by equation nλ = 2d sinθ λ= X‐ray wavelength d = distance between lattice planes θ= angle of incidence with lattice plane n = integer

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